Features
- The input range is field programmable for each channel.
- Each channel includes an anti-aliasing filter and a low-pass filter with a programmable breakpoint.
- All channels have continuous background Built-In-Test (BIT).
- The module(s) also include extended A/D FIFO buffering capabilities for greater storage/management of the incoming samples for post processing applications
Built-In Test (BIT)/Diagnostic Capability
Three different tests, one online (D2) and two off-line (D0, D3), can be selected:
The online (D2) test initiates automatic background BIT testing, where each channel is checked to a test accuracy of 0.2% FS. Any failure triggers an Interrupt (if enabled) with the results available in BIT status register. The testing is totally transparent to the user, requires no external programming, has no effect on the operation of this card and can be enabled or disabled via the bus. In addition, all channels are monitored for open input.
Platforms Supported
3U VPX (3 Modules) 6U VPX (6 Modules) 3U cPCI (3 Modules)
6U cPCI (6 Modules) VME (6 Modules) PCIe (3 Modules)